King Combs

Guide to X-ray Diffraction in Materials Science

Introduction

X-ray diffraction is a versatile characterization technique that provides in-depth information about the atomic and molecular structure of materials.

Working Principle

X-rays are electromagnetic radiation with a wavelength close to the atomic spacing, making them ideal for probing the structure of crystals. When X-rays interact with a crystal, they are scattered by the electrons in the atoms.

The scattered radiation forms a diffraction pattern, where the intensity and angle of the scattered beams are indicative of the atomic arrangement within the material.

Applications

Phase Identification

X-ray diffraction can identify different crystalline phases present in a material. It can also help differentiate between amorphous and crystalline materials.

Crystal Structure Determination

By analyzing the diffraction pattern, the crystal structure of a material can be determined, including its unit cell parameters and atomic positions.

Texture Analysis

X-ray diffraction can provide information about the preferred orientation of crystals in a material. This is known as texture analysis, and it is useful in understanding the mechanical and physical properties of materials.

Strain Measurement

X-ray diffraction can be used to measure strain in materials, which can be caused by mechanical deformation or thermal effects.

Thin Film Characterization

X-ray diffraction is a valuable tool for characterizing thin films, such as their thickness, crystal structure, and surface roughness.

Advantages

• Non-destructive nature
• Provides information on both crystal structure and strain
• Wide range of applications, from phase identification to thin film characterization